This page is powered by Blogger. Isn't yours?

Wednesday, August 20, 2008

FLURISA LIDAR Concepts, Principals and Applications Workshop to be Held Today in Tampa, FL

The Florida Chapter of URISA in conjunction with the Annual Florida Surveyors and Mapping Society Conference will be holding a "LIDAR Concepts, Principals and Applications Workshop" today, August 20th, 2008 in Tampa, FL.

This URISA International certified workshop will be held at:

Marriott Tampa Waterside Hotel
700 South Florida Avenue
Tampa, FL
Telephone 813.204.6338

Fee: $60

We invite all FLURISA members and others interested in LIDAR technology who want to get a basic understanding of how the tool works, what map production is like and how they are able to incorporate this type of data into their GIS.

The workshop is separate registration from the conference. We encourage you check the offerings at the FSMS conference but you are not required to register for the FSMS conference to attend this workshop. You can register for this workshop by filling out the attached flier and submitting it to FSMS.

For more information on FSMS’s conference please use this link:


As you are all aware, URISA International Workshops can be used for Continuing Education credits toward maintaining your GISP certification. We look forward to seeing many of you at this workshop.

Course Description:

Instructor: Brian Raber, Merrick & Co.

LIDAR Concepts, Principals and Applications

LIDAR (Light Detection and Ranging) has become widely accepted tool to generate accurate terrain models used in a variety of GIS applications. This workshop will provide an overview of this exciting technology. A history of this advanced mapping tool will be discussed as well as a review it’s current and future trends. The workshop will describe potential applications and will provide case studies of how this data has been used by agencies throughout the United States.

Specific topics include:

• LIDAR technology summary and how it works

• Mapping workflow and processes

• Quality control and potential error

• Future trends

• Case studies